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Volumn , Issue , 1999, Pages 252-254

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY CONSERVATION; ENERGY UTILIZATION; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS;

EID: 0033359156     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/313817.313937     Document Type: Article
Times cited : (94)

References (7)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.