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Volumn 6, Issue 2, 2006, Pages 243-247

Mechanical property of the low dielectric carbon doped silicon oxide thin film grown from MTMS/O2 source

Author keywords

Elastic modulus; Hardness; Low k; MTMS; SiOC( H) film

Indexed keywords

CARBON; ELASTIC MODULI; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HARDNESS; NANOSTRUCTURED MATERIALS; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

EID: 27744545698     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.07.049     Document Type: Conference Paper
Times cited : (16)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.