Spectrum-based BIST in complex SOCs

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 111-116

  Kasturirangan, G ^a   Hsiao, M S ^b  

^a INTEL CORPORATION   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Built in self test

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP;

BIST TECHNIQUES; DOMINANT INPUT; EMBEDDED CORES; SPECTRAL CHARACTERISTICS; SPECTRAL PATTERNS; SPECTRAL PROPERTIES; SYSTEM ON A CHIP; TEST VECTORS;

BUILT-IN SELF TEST;

EID: 27744543625     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011120     Document Type: Conference Paper

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