On-wafer noise characterization of low-noise amplifiers in the Ka-band

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 5, 2003, Pages 1606-1610

  Long, Sabine ^a   Escotte, Laurent ^a   Graffeuil, Jacques ^a   Brasseau, Francis ^b   Cazaux, Jean Louis ^b  

^a UNIVERSITÉ PAUL SABATIER   (France)

^b THALES ALENIA SPACE   (France)

Author keywords

Low noise amplifier (LNA); Multiple impedance technique; Noise; Noise figure; Noise parameters

Indexed keywords

COMPUTER SIMULATION; ELECTRIC ADMITTANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYZERS; ELECTRIC SWITCHES; MICROWAVE AMPLIFIERS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SIGNAL RECEIVERS; SPECTRUM ANALYZERS; STATISTICAL METHODS;

LOW NOISE AMPLIFIER; MULTI-IMPEDANCE TECHNIQUE; NOISE FIGURE; ON-WAFER NOISE CHARACTERIZATION; Y-FACTOR TECHNIQUE;

SIGNAL NOISE MEASUREMENT;

EID: 0242551685     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.817156     Document Type: Article

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