Polarization effects in reflection-mode scanning near-field optical microscopy

Journal of Applied Physics

Volumn 83, Issue 4, 1998, Pages 1837-1843

  Durkan, C ^a,b   Shvets, I V ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT EMISSION; LIGHT POLARIZATION; LIGHT REFLECTION; METALS; MICROSCOPES; SURFACES;

OPTICAL IMAGE CONTRAST; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032003639     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366906     Document Type: Article

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