A system-level alternate test approach for specification test of RF transceivers in loopback mode

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2005, Pages 289-294

  Halder, A ^a   Bhattacharya, S ^a   Srinivasan, G ^a   Chatterjee, A ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Analog and mixed signal test; Loop back test; RF test; Specification test; System level test; Wireless transceiver test

Indexed keywords

COMPUTER HARDWARE; DATA REDUCTION; GLOBAL SYSTEM FOR MOBILE COMMUNICATIONS; NATURAL FREQUENCIES; SIGNAL RECEIVERS; TRANSCEIVERS;

ANALOG AND MIXED-SIGNAL TEST; LOOP-BACK TEST; RF TEST; SPECIFICATION TEST; SYSTEM-LEVEL TEST; WIRELESS TRANSCEVIERS TEST;

TRANSMITTERS;

EID: 27644592387     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icvd.2005.34     Document Type: Conference Paper

References (11)

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