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Volumn 105, Issue 1-4, 2005, Pages 148-154
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Interpretation of DNA adsorption on silanized surfaces by measuring interaction forces at various pHs using atomic force microscopy
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Author keywords
Adhesive force; DNA adsorption; Electrical double layer (EDL) force; Force distance curves; Silanized glass substrate surfaces
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Indexed keywords
ADHESIVES;
ATOMIC FORCE MICROSCOPY;
DNA;
FLUORESCENCE;
GLASS;
SUBSTRATES;
SURFACES;
VAN DER WAALS FORCES;
ADHESIVE FORCE;
DNA ABSORPTION;
ELECTRICAL DOUBLE LAYERS (EDL) LAYERS;
FORCE-DISTANCE CURVES;
SILANIZED GLASS SUBSTRATE SURFACES;
SILANES;
BUFFER;
DNA;
GLASS;
N HEXADECYLTRIMETHOXYSILANE;
N PROPYLTRIMETHOXYSILANE;
SILANE DERIVATIVE;
UNCLASSIFIED DRUG;
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
CONFERENCE PAPER;
DENSITY;
FLUORESCENCE MICROSCOPY;
FORCE;
MEASUREMENT;
MOLECULE;
PH;
SURFACE PROPERTY;
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EID: 27544472374
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2005.06.031 Document Type: Conference Paper |
Times cited : (7)
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References (31)
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