Combining error masking and error detection plus recovery to combat soft errors in static CMOS circuits

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2005, Pages 40-49

  Krishnamohan, Srivathsan ^a   Mahapatra, Nihar R ^a  

^a Michigan State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL NOISE; ERROR MASKING; SINGLE-EVENT TRANSIENTS; SOFT-ERROR RATE (SER);

CMOS INTEGRATED CIRCUITS; FLIP FLOP CIRCUITS; LOGIC CIRCUITS; SPURIOUS SIGNAL NOISE; VECTORS;

ERROR DETECTION;

EID: 27544465353     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2005.27     Document Type: Conference Paper

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