|
Volumn 2, Issue 7, 2005, Pages 2289-2292
|
Morphology and optical properties of InN layers grown by molecular beam epitaxy on silicon substrates
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COALESCENCE;
CRYSTALLINE MATERIALS;
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
OPTICAL PROPERTIES;
PHOTOLUMINESCENCE;
PLASMA APPLICATIONS;
SILICON;
SUBSTRATES;
FULL WIDTH AT HALF MAXIMUM (FWHM);
NITROGEN MOLECULAR FLUX RATIO;
SILICON SUBSTRATES;
INDIUM COMPOUNDS;
|
EID: 27344436080
PISSN: 16101634
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1002/pssc.200461571 Document Type: Conference Paper |
Times cited : (23)
|
References (9)
|