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Volumn 2, Issue 7, 2005, Pages 2895-2898

Fabrication and characterization of GaN-based distributed Bragg reflector mirrors for low lasing threshold and integrated photonics

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; GALLIUM NITRIDE; ION BEAMS; NUMERICAL ANALYSIS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS;

EID: 27344434690     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461543     Document Type: Conference Paper
Times cited : (7)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.