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Volumn 34, Issue 13, 1998, Pages 1315-1316
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Improvement of GaN-based laser diode facets by FIB polishing
a b a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CURRENT VOLTAGE CHARACTERISTICS;
ION BEAMS;
LIGHT MEASUREMENT;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MIRRORS;
POLISHING;
QUANTUM EFFICIENCY;
REACTIVE ION ETCHING;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
FOCUSED ION BEAM (FIB) POLISHING;
SEMICONDUCTOR LASERS;
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EID: 0032091901
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19980886 Document Type: Article |
Times cited : (30)
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References (5)
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