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Volumn 34, Issue 13, 1998, Pages 1315-1316

Improvement of GaN-based laser diode facets by FIB polishing

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ION BEAMS; LIGHT MEASUREMENT; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MIRRORS; POLISHING; QUANTUM EFFICIENCY; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0032091901     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980886     Document Type: Article
Times cited : (30)

References (5)
  • 2
    • 0002864028 scopus 로고    scopus 로고
    • Group III nitride semiconductors for short wavelength light emitting devices
    • ORTON, J.W., and FOXON, C.T.: 'Group III nitride semiconductors for short wavelength light emitting devices', Rep. Prog. Phys., 1998, 61, pp. 1-75
    • (1998) Rep. Prog. Phys. , vol.61 , pp. 1-75
    • Orton, J.W.1    Foxon, C.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.