Scalable approach for lensless imaging at x-ray wavelengths

Applied Physics Letters

Volumn 84, Issue 17, 2004, Pages 3373-3375

  Eisebitt, S ^a   Lorgen M ^a   Eberhardt, W ^a   Luning J ^b   Andrews, S ^b   Stohr J ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PATTERNS; SPATIAL FREQUENCY; SPATIAL RESOLUTION; X-RAY WAVELENGTHS;

BANDWIDTH; DETECTORS; FOURIER TRANSFORMS; OPTICAL RESOLVING POWER; PHOTONS; SCANNING TUNNELING MICROSCOPY; SYNCHROTRON RADIATION; X RAY DIFFRACTION; X RAYS;

IMAGING TECHNIQUES;

EID: 2542475225     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1728320     Document Type: Article

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