Remarks on the electrochemical application of optical methods for the determination of stress in electrodes

Electrochimica Acta

Volumn 51, Issue 1, 2005, Pages 93-97

  Rokob, T A ^a   Lang G G ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Bending beam method; Bending cantilever; Film stress; Refraction; Schnell's law

Indexed keywords

CANTILEVER BEAMS; DATA REDUCTION; ELECTROCHEMISTRY; ERROR ANALYSIS; LIGHT REFRACTION; STRESS ANALYSIS;

BENDING BEAM METHOD; BENDING CANTILEVER; FILM STRESS; SCHNELL'S LAW;

ELECTRODES;

EID: 25444516302     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.04.006     Document Type: Article

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