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Volumn 1, Issue 10, 1999, Pages 483-487
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Investigation by electrochemical and deflectometric techniques of silicon dissolution and passivation in alkali
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Author keywords
Bending beam method; Probe beam deflection; Silicon dissolution passivation
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Indexed keywords
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EID: 0001388382
PISSN: 13882481
EISSN: None
Source Type: Journal
DOI: 10.1016/S1388-2481(99)00102-2 Document Type: Article |
Times cited : (23)
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References (23)
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