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Volumn 1, Issue 10, 1999, Pages 483-487

Investigation by electrochemical and deflectometric techniques of silicon dissolution and passivation in alkali

Author keywords

Bending beam method; Probe beam deflection; Silicon dissolution passivation

Indexed keywords


EID: 0001388382     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1388-2481(99)00102-2     Document Type: Article
Times cited : (23)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.