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Volumn 108, Issue 19, 2004, Pages 4180-4186

Homogeneous reduction of haloacetonitriles by electrogenerated aromatic radical anions: Determination of the reduction potential of .CH 2CN

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DISSOCIATION; FREE ENERGY; FREE RADICALS; IRRADIATION; MATHEMATICAL MODELS; MOLECULAR STRUCTURE; QUANTUM THEORY; REACTION KINETICS; REDUCTION; SOLVENTS;

EID: 2542482501     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp036782a     Document Type: Article
Times cited : (55)

References (81)
  • 1
    • 77956772881 scopus 로고
    • For reviews, see: (a) Savéant, J.-M. Adv. Phys. Org. Chem. 1990, 26, 1. (b) Savéant, J.-M, Adv. Phys. Org. Chem. 2000, 35, 117. (c) Maran, F.; Wayner, D. D. M.; Workentin, M. S. Adv. Phys. Org. Chem. 2001, 36, 85.
    • (1990) Adv. Phys. Org. Chem. , vol.26 , pp. 1
    • Savéant, J.-M.1
  • 2
    • 35449001112 scopus 로고    scopus 로고
    • For reviews, see: (a) Savéant, J.-M. Adv. Phys. Org. Chem. 1990, 26, 1. (b) Savéant, J.-M, Adv. Phys. Org. Chem. 2000, 35, 117. (c) Maran, F.; Wayner, D. D. M.; Workentin, M. S. Adv. Phys. Org. Chem. 2001, 36, 85.
    • (2000) Adv. Phys. Org. Chem. , vol.35 , pp. 117
    • Savéant, J.-M.1
  • 3
    • 0002603828 scopus 로고    scopus 로고
    • For reviews, see: (a) Savéant, J.-M. Adv. Phys. Org. Chem. 1990, 26, 1. (b) Savéant, J.-M, Adv. Phys. Org. Chem. 2000, 35, 117. (c) Maran, F.; Wayner, D. D. M.; Workentin, M. S. Adv. Phys. Org. Chem. 2001, 36, 85.
    • (2001) Adv. Phys. Org. Chem. , vol.36 , pp. 85
    • Maran, F.1    Wayner, D.D.M.2    Workentin, M.S.3
  • 65
    • 2542441075 scopus 로고    scopus 로고
    • note
    • D ratios (typically 50 or 100) so that the ET reaction can be considered to be pseudo-first order and the effect of reaction 13 on the concentration of RX negligible.
  • 70
    • 0039043410 scopus 로고
    • NIST Standard Reference Database 25; U.S. Department of Commerce: Gaithersburg, MD
    • NIST Structures and Properties Database and Estimation Program; NIST Standard Reference Database 25; U.S. Department of Commerce: Gaithersburg, MD, 1991.
    • (1991) NIST Structures and Properties Database and Estimation Program
  • 71
    • 2542433545 scopus 로고    scopus 로고
    • note
    • RX/R.+X-° values are ca. 0.2 V more negative than the previous estimations.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.