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Volumn 121, Issue 31, 1999, Pages 7239-7248

Kinetics of the reduction of dialkyl peroxides. New insights into the dynamics of dissociative electron transfer

Author keywords

[No Author keywords available]

Indexed keywords

PEROXIDE;

EID: 0033546675     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja9906148     Document Type: Article
Times cited : (105)

References (65)
  • 1
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    • Issued as NRCC Publication No. 42182
    • Issued as NRCC Publication No. 42182.
  • 4
    • 0001944393 scopus 로고
    • Mattay, J., Ed.; Springer-Verlag: Berlin
    • (a) Saeva, F. D. In Topics in Current Chemistry; Mattay, J., Ed.; Springer-Verlag: Berlin, 1990; Vol. 156, p 59.
    • (1990) Topics in Current Chemistry , vol.156 , pp. 59
    • Saeva, F.D.1
  • 6
    • 0003213468 scopus 로고
    • Mattay, J., Ed.; Springer-Verlag: Berlin
    • (c) Maslak, P. In Topics in Current Chemistry; Mattay, J., Ed.; Springer-Verlag: Berlin, 1993; Vol. 168, p 1.
    • (1993) Topics in Current Chemistry , vol.168 , pp. 1
    • Maslak, P.1
  • 26
    • 0344899241 scopus 로고    scopus 로고
    • note
    • 20 and thus with the Stokes-Einstein relation. Analogous results are obtained with the other peroxides. This is relevant because it means that the number of exchanged electrons is the same in both solvents, within error.
  • 46
    • 33845278203 scopus 로고
    • but the electrochemistry is ill-defined
    • In principle it is possible to generate a constant concentration of these radicals and to study their reduction by photomodulated voltammetry, as previously done with many other radicals (Wayner, D. D. M.; McPhee, D. J.; Griller, D. J. Am. Chem. Soc. 1988, 110, 132), but the electrochemistry is ill-defined.
    • (1988) J. Am. Chem. Soc. , vol.110 , pp. 132
    • Wayner, D.D.M.1    McPhee, D.J.2    Griller, D.3
  • 47
    • 0003450764 scopus 로고
    • NIST Structures and Properties Database and Estimation Program, U.S. Department of Commerce: Gaithersburg, MD
    • NIST Standard Reference Database 25; NIST Structures and Properties Database and Estimation Program, U.S. Department of Commerce: Gaithersburg, MD, 1991.
    • (1991) NIST Standard Reference Database , vol.25
  • 49
    • 0344899237 scopus 로고    scopus 로고
    • note
    • ox, = 0.08 V).
  • 53
    • 0344036352 scopus 로고    scopus 로고
    • note
    • ○ ≈ 0.5, as expected for any moderately driven activated process.
  • 56
    • 0344036351 scopus 로고    scopus 로고
    • note
    • tr to the ionic radius (the range of values is from -87 meV/K for fluoride to -107 meV/K for thiocyanate).
  • 57
    • 0345330282 scopus 로고    scopus 로고
    • note
    • -1, as used by Savéant in his treatment of tert-butyl bromide, increases the predicted rate constants by 1.5 orders of magnitude, so they appear to overlap the closed circles in Figure 2.
  • 59
    • 0344467479 scopus 로고    scopus 로고
    • note
    • 2m] (dr/dα).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.