The influence of crystallization route on the properties of lanthanum-doped Bi4Ti3O12 thin films prepared from polymeric precursors

Materials Science and Engineering: B

Volumn 113, Issue 3, 2004, Pages 207-214

  Simoes A Z ^a   Riccardi, C S ^a   Quinelato, C ^a   Ries, A ^a   Longo, E ^b   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

Ceramics; Electrical measurements; Film deposition; Thin films

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; CRYSTALLIZATION; DOPING (ADDITIVES); ELECTRIC VARIABLES MEASUREMENT; FERROELECTRICITY; GRAIN SIZE AND SHAPE; LANTHANUM; MICROSTRUCTURE; POLYMERS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC PROPERTIES; FILM DEPOSITION; HYDSTERESIS LOOPS; MULTILAYERED FILMS;

BISMUTH COMPOUNDS;

EID: 6344229837     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2004.08.004     Document Type: Article

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