Three-dimensional phase field simulation for surface roughening of heteroepitaxial films with elastic anisotropy

Journal of Crystal Growth

Volumn 284, Issue 1-2, 2005, Pages 281-292

  Ni, Y ^a,b   He, L H ^a   Soh, A K ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

A1. Anisotropy; A1. Phase field method; A1. Surface morphology; A3. Epitaxy

Indexed keywords

ANISOTROPY; ANNEALING; COMPUTER SIMULATION; CRYSTAL LATTICES; ELASTIC MODULI; MATHEMATICAL MODELS; SURFACE ROUGHNESS; THIN FILMS;

ELASTIC ANISOTROPY; HETEROEPITAXIAL FILMS; PHASE FIELD METHOD;

EPITAXIAL GROWTH;

EID: 25144454075     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.07.026     Document Type: Article

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