Effect of high-temperature annealing on the structural and optical properties of ZnO films

Thin Solid Films

Volumn 491, Issue 1-2, 2005, Pages 323-327

  Wang, Li ^a   Pu, Yong ^a   Fang, Wenqing ^a   Dai, Jiangnan ^a   Zheng, Changda ^a   Mo, Chunlan ^a   Xiong, Chuanbin ^a   Jiang, Fengyi ^a  

^a NANCHANG UNIVERSITY   (China)

Author keywords

Annealing; Optical properties; X ray diffraction; Zinc oxide

Indexed keywords

ANNEALING; DISLOCATIONS (CRYSTALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; X RAY DIFFRACTION; ZINC OXIDE;

DOUBLE-CRYSTAL X-RAY DIFFRACTION; HIGH-TEMPERATURE ANNEALING; SCREW-DISLOCATIONS; ZNO THIN FILMS;

THIN FILMS;

EID: 25144438085     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.05.048     Document Type: Article

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