Intrinsic spatial resolution of semiconductor X-ray detectors: A simulation study

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 531, Issue 1-2, 2004, Pages 75-81

  Hoheisel, M ^a   Giersch, J ^b   Bernhardt, P ^a  

^a SIEMENS AG   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Absorber; Detectors; Medical X ray imaging; Modulation transfer function; Monte Carlo simulation; Photon counting

Indexed keywords

COMPUTER SIMULATION; DETECTORS; ENERGY DISSIPATION; IMAGE INTENSIFIERS (ELECTRON TUBE); IMAGING TECHNIQUES; MAMMOGRAPHY; MONOCHROMATORS; MONTE CARLO METHODS; SIGNAL PROCESSING; X RAY SCATTERING;

ABSORBERS; MEDICAL X-RAY IMAGING; MODULATION TRANSFER FUNCTIONS; PHOTON COUNTING; SPATIAL RESOLUTIONS;

SEMICONDUCTOR MATERIALS;

EID: 4644223071     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.05.077     Document Type: Conference Paper

References (5)

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2. Hajdok G., Battista J.J., Cunningham I.A. Proc. SPIE. 5030:2003;1.
3. Hoheisel M., Bätz L. Thin Solid Films. 383:2001;132.
4. Giersch J., Weidemann A., Anton G. Nucl. Instr. and Meth. A. 509:2003;151.
5. Cunningham I.A., Reid B.K. Med. Phys. 19:1992;1037.