Detectors for X-ray diffraction and scattering: A user's overview

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 531, Issue 1-2, 2004, Pages 292-301

  Brügemann, Lutz ^a   Gerndt, Ekkehard K E ^a  

^a BRUKER AXS GMBH   (Germany)

Author keywords

Detector; Material research; Technology transfer; X ray; X ray diffraction; X ray scattering

Indexed keywords

ABSORPTION; CHARGE COUPLED DEVICES; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; PHOTONS; SINGLE CRYSTALS; TECHNOLOGY TRANSFER; X RAY POWDER DIFFRACTION; X RAY SCATTERING; X RAYS;

CRITICAL DETECTOR PARAMETERS; INTER-ATOMIC DISTANCES; MATERIAL RESEARCH; X-RAY FLUORESCENCE ANALYSIS;

RADIATION DETECTORS;

EID: 4544332090     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.06.019     Document Type: Conference Paper

References (5)

1. Cullity B.D. Elements of X-ray Diffraction. 1956;Addison-Wesley, Reading, MA.
2. Jenkins R., Snyder R.L. Introduction to X-ray Powder Diffractometry. 1996;Wiley, New York, NY.
3. Rietveld H.M. Acta Crystallogr. 22:1967;151 Rietveld H.M. J. Appl Crystallogr. 2:1969;65.
4. Rietveld H.M. Acta Crystallogr. 22:1967;151 Rietveld H.M. J. Appl Crystallogr. 2:1969;65.
5. A.C. Thompson, et al., X-ray Data Booklet, LBNL/PUB-490 Rev.2 (2001) or http://xdb.lbl.gov.