X-ray powder crystallography with vertex instrumentation

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 418, Issue 1, 1998, Pages 173-185

  Chatzisotiriou, V ^a   Christofis, I ^b   Dimitriou, N ^c   Dre, Ch ^d   Haralabidis, N ^e   Karvelas, S ^c   Karydas, A G ^c   Loukas, D ^c   Misiakos, K ^e   Pavlidis, A ^c   Perdikatsis, V ^f   Psycharis, V ^a   Spirou, S ^c   Terzis, A ^a   Turchetta, R ^g   Tsoi, E ^e  

^a INSTITUTE OF MATERIALS SCIENCE   (Greece)

^b General Machining SA   (Greece)

^c INSTITUTE OF NUCLEAR PHYSICS   (Greece)

^d Intracom Holdings SA   (Greece)

^e INSTITUTE OF MICROELECTRONICS   (Greece)

^f INSTITUTE OF GEOLOGY AND MINERAL EXPLORATION   (Greece)

^g LEPSI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COUNTING CIRCUITS; DIFFRACTOMETERS; DISCRIMINATORS; GONIOMETERS; MICROSTRIP DEVICES; PULSE SHAPING CIRCUITS; READOUT SYSTEMS; SILICON SENSORS; VLSI CIRCUITS; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

SILICON MICROSTRIP DETECTORS; X RAY DIFFRACTOMETERS;

RADIATION DETECTORS;

EID: 0032202468     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00731-1     Document Type: Article

References (7)

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