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Review of Scientific Instruments

Volumn 67, Issue 6, 1996, Pages 2289-2296

Ultrahigh vacuum scanning force/scanning tunneling microscope: Application to high-resolution imaging of Si(111)7x7

(3) Olsson, L a Wigren, R a Erlandsson, R a

a LINKÖPING UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004994758 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1146935 Document Type: Article

Times cited : (17)

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