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Volumn 2, Issue , 2005, Pages 1103-1108

A low temperature, hermetic wafer level packaging method for RF MEMS switch

Author keywords

Au Sn bonding; Hermeticity; RF MEMS Packaging

Indexed keywords

BONDING; ELECTRIC SWITCHES; EUTECTICS; GOLD; HERMETIC DEVICES; METALLIZING; MICROELECTROMECHANICAL DEVICES; MULTILAYERS; NICKEL; OXIDATION; SILICON WAFERS; TITANIUM;

EID: 24644441047     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (9)
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    • Fabrication and accelerated hermeticity testing of an on wafer packaging for RF MEMS
    • Alexanders Margomenos, Linda P. B. Katei. "Fabrication and accelerated hermeticity testing of an on wafer packaging for RF MEMS," IEEE transactions on microwave theory and techniques, Vol. 52, No.6 (2004), pp.1626-1636.
    • (2004) IEEE Transactions on Microwave Theory and Techniques , vol.52 , Issue.6 , pp. 1626-1636
    • Margomenos, A.1    Katei, L.P.B.2
  • 4
    • 4444368874 scopus 로고    scopus 로고
    • Cantilever-Type microrlrctromechanical Systems probe card with thorough-wafer interconnections for fine pitch and high-speed testing
    • Bong-Hwan Kim, Hyun-Chul Kim, Kukjin Chun, et al, "Cantilever-Type microrlrctromechanical Systems probe card with thorough-wafer interconnections for fine pitch and high-speed testing," Japanese Journal of Applied Physics, Vol. 43, No. 6B (2004), pp.3877-3881.
    • (2004) Japanese Journal of Applied Physics , vol.43 , Issue.6 B , pp. 3877-3881
    • Kim, B.-H.1    Kim, H.-C.2    Chun, K.3
  • 5
    • 1642369517 scopus 로고    scopus 로고
    • Advanced processing techniques for through-wafer interconnects
    • Jan/Feb.
    • S.L. Burkett, X. Qiao, D. Temple, B. Stoner, G. Mcguire. "Advanced processing techniques for through-wafer interconnects," J. Vac. Sci. Technol. B22 (1), Jan/Feb., 2004,pp.248-256.
    • (2004) J. Vac. Sci. Technol. , vol.B22 , Issue.1 , pp. 248-256
    • Burkett, S.L.1    Qiao, X.2    Temple, D.3    Stoner, B.4    Mcguire, G.5
  • 6
    • 0033904174 scopus 로고    scopus 로고
    • Localized silicon fusion and eutectic bonding for MEMS fabrication and packaging
    • Y. T. Cheng, Liwei Lin, Khalil Najafi, "Localized Silicon Fusion and Eutectic Bonding for MEMS Fabrication and Packaging,"Journal of microelectromechanical systems, VOL. 9, NO. 1, (2000), pp. 3-8.
    • (2000) Journal of Microelectromechanical Systems , vol.9 , Issue.1 , pp. 3-8
    • Cheng, Y.T.1    Lin, L.2    Najafi, K.3
  • 7
    • 0032146217 scopus 로고    scopus 로고
    • Microstructural characterization of Au/Sn solder for packaging in optoelectronic applications
    • D. G. Ivey. "Microstructural characterization of Au/Sn solder for packaging in optoelectronic applications." Micron. Vol. 29, No.4 (1998), pp. 281-287.
    • (1998) Micron. , vol.29 , Issue.4 , pp. 281-287
    • Ivey, D.G.1
  • 8
    • 24644446605 scopus 로고    scopus 로고
    • Robert Bosch Gmbh. U.S. Patent 5501893
    • Franz Laermer, Andrea Schilp, Robert Bosch Gmbh. U.S. Patent 5501893 (1996).
    • (1996)
    • Laermer, F.1    Schilp, A.2
  • 9
    • 0742286282 scopus 로고    scopus 로고
    • Sidewall roughness control in advanced silicon etch process
    • H. C. Liu, Y. H. Lin, W. Hsu. "Sidewall roughness control in advanced silicon etch process," Microsystem Technologies 10 (2003), pp. 29-34.
    • (2003) Microsystem Technologies , vol.10 , pp. 29-34
    • Liu, H.C.1    Lin, Y.H.2    Hsu, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.