Study of bulk grown silicon-germanium radiation detectors

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 5081-5087

  Ruzin, A ^a   Marunko, S ^a   Gusakov, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARACTERIZATION; CRYSTAL GROWTH FROM MELT; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; GERMANIUM; LOW TEMPERATURE EFFECTS; PHOTONS; SILICON; SINGLE CRYSTALS; X RAYS;

GAMMA-RAY PHOTONS; TRANSIENT CURRENTS; X-RAY DETECTORS;

RADIATION DETECTORS;

EID: 2442519298     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1688462     Document Type: Article

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