Electrical defect study in thin-film SiGe/Si solar cells

Materials Science in Semiconductor Processing

Volumn 4, Issue 1-3, 2001, Pages 331-334

  Daami, A ^a   Zerrai, A ^a   Marchand, J J ^a   Poortmans, J ^b   Bremond G ^a  

^a INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DEEP LEVEL TRANSIENT SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; THIN FILM DEVICES;

ELECTRICAL DEFECTS;

SOLAR CELLS;

EID: 0035247739     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(00)00101-3     Document Type: Article

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