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Volumn 13, Issue 4-8, 2004, Pages 1111-1115
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Synthesis and microstructural characterisation of reactive RF magnetron sputtering AlN films for surface acoustic wave filters
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Author keywords
Aluminium nitride; Microstructure; Sputtering; Surface acoustic wave devices
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON DIFFRACTION;
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SILICON;
SURFACE ROUGHNESS;
SYNTHESIS (CHEMICAL);
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
COUPLING COEFFICIENT;
PHASE VELOCITY;
SURFACE ACOUSTIC WAVES (SAW);
ACOUSTIC SURFACE WAVE FILTERS;
DIAMOND;
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EID: 2442505629
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2003.11.064 Document Type: Article |
Times cited : (50)
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References (16)
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