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Volumn 325, Issue 1-2, 2002, Pages 380-388

Growth mechanism of reactively sputtered aluminum nitride thin films

Author keywords

Aluminum nitride; Growth mechanism; Microstructure; Reactive sputtering; Thin film

Indexed keywords

ALUMINUM NITRIDE; CRYSTALLOGRAPHY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0037186787     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01477-0     Document Type: Article
Times cited : (80)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.