Dependence of stresses on grain orientations in thin polycrystalline films on substrates: An explanation of the relationship between preferred orientations and stresses

Applied Surface Science

Volumn 180, Issue 1-2, 2001, Pages 1-5

  Zhang, Jian Min ^a,b   Xu, Ke Wei ^b   Ji, Vincent ^c  

^a SHAANXI NORMAL UNIVERSITY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

^c EUROPEAN SPACE AGENCY   (France)

Author keywords

Relationship; Residual stress; Texture

Indexed keywords

CRYSTAL ORIENTATION; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; STRESS ANALYSIS; SUBSTRATES; TENSILE STRESS; TEXTURES; THIN FILMS;

GRAIN ORIENTATION;

METALLIC FILMS;

EID: 0035426626     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00243-4     Document Type: Article

References (17)