|
Volumn 13, Issue 4-8, 2004, Pages 1385-1390
|
Ultra-thin tetrahedral amorphous carbon films with strong adhesion, as measured by nanoscratch testing
|
Author keywords
Adhesion; Critical load; Hardness; Internal stress
|
Indexed keywords
ADHESION;
CATHODES;
ENERGY DISPERSIVE SPECTROSCOPY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
AMORPHOUS CARBON;
SLOPE RATIO PROTOCOL;
TOOLING COMPONENT;
DIAMONDS;
DIAMOND;
|
EID: 2442455503
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2003.11.025 Document Type: Article |
Times cited : (26)
|
References (17)
|