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Volumn 14, Issue 3, 2004, Pages 732-737

MBE-grown AlGaN/GaN HEMTs on SiC

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); GALLIUM NITRIDE; LEAKAGE CURRENTS; MOLECULAR BEAM EPITAXY; NUCLEATION; SILICON CARBIDE;

EID: 24144480580     PISSN: 01291564     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0129156404002752     Document Type: Conference Paper
Times cited : (4)

References (11)
  • 3
    • 0038476602 scopus 로고    scopus 로고
    • Unpassivated AlGaN-GaN HEMTs with minimal RF dispersion grown by plasma-assisted MBE on semi-insulating 6H-SiC substrates
    • N. G. Weimann, M. J. Manfra, and T. Wächtler, "Unpassivated AlGaN-GaN HEMTs with Minimal RF Dispersion Grown by Plasma-Assisted MBE on Semi-Insulating 6H-SiC Substrates," IEEE Electron Device Letters, vol. 24, p. 57, 2003.
    • (2003) IEEE Electron Device Letters , vol.24 , pp. 57
    • Weimann, N.G.1    Manfra, M.J.2    Wächtler, T.3
  • 7
    • 3242723280 scopus 로고    scopus 로고
    • Effect of carbon doping on buffer leakage in AlGaN/GaN high electron mobility transistors
    • C. Poblenz, P. Waltereit, S. Rajan, U. K. Mishra, and J. S. Speck, "Effect of carbon doping on buffer leakage in AlGaN/GaN high electron mobility transistors, " J.Vac.Sc.Tech. B, vol. 22, p. 1145, 2004.
    • (2004) J.Vac.Sc.Tech. B , vol.22 , pp. 1145
    • Poblenz, C.1    Waltereit, P.2    Rajan, S.3    Mishra, U.K.4    Speck, J.S.5
  • 9
    • 79956003090 scopus 로고    scopus 로고
    • Dislocation and morphology control during molecular-beam epitaxy of AlGaN/GaN heterostructures directly on sapphire substrates
    • M. J. Manfra, N. G. Weimann, J. W. P. Hsu, L. N. Pfeiffer, and K. W. West, "Dislocation and morphology control during molecular-beam epitaxy of AlGaN/GaN heterostructures directly on sapphire substrates," Appl. Phys. Lett., vol. 81, p. 1456, 2002.
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 1456
    • Manfra, M.J.1    Weimann, N.G.2    Hsu, J.W.P.3    Pfeiffer, L.N.4    West, K.W.5
  • 10
    • 2442460131 scopus 로고    scopus 로고
    • Growth of GaN buffer layers on 4H-SiC(0001) by plasma assisted molecular beam epitaxy for high mobility electron transistors
    • submitted for publication
    • P. Waltereit, C. Poblenz, S. Rajan, U. K. Mishra, and J. S. Speck, "Growth of GaN buffer layers on 4H-SiC(0001) by plasma assisted molecular beam epitaxy for high mobility electron transistors," Appl. Phys. Lett., submitted for publication.
    • Appl. Phys. Lett.
    • Waltereit, P.1    Poblenz, C.2    Rajan, S.3    Mishra, U.K.4    Speck, J.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.