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Overlayer thickness evaluated using the expression ln ICu =- (dλ sin θ) +K where ICu is the intensity, K is a constant. For Cu 2 p32 photoelectrons, we use an attenuation length λ=1.8 nm.
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Overlayer thickness evaluated using the expression ln ICu =- (dλ sin θ) +K where ICu is the intensity, K is a constant. For Cu 2 p32 photoelectrons, we use an attenuation length λ=1.8 nm.
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18
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Theoretical intensities were calculated as a function of take-off angle for a four-molecule bilayer system. C-C, Si-O, and S-C bond lengths [obtained from J. R. Colorado and T. R. Lee, J. Phys. Chem. B 107, 10216 (2003)
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and CRC Handbook of Chemistry and Physcs, edited by, D. R. Lide, (CRC Press, Cleveland, OH, 2004)] were used to evaluate the distance d of each atom from the Cu surface. By varying the ratio of the sulfur and sulfonated molecules, a best model structure was simulated.
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