The complex formation of ripples during depth profiling of Si with low energy, grazing oxygen beams

Applied Physics Letters

Volumn 73, Issue 3, 1998, Pages 315-317

  Jiang, Z X ^a   Alkemade, P F A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 12244254710     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121819     Document Type: Article

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