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Volumn 80, Issue , 1996, Pages 449-452

Interface roughness and density characterization of multilayer mirrors by using x-ray standing waves

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EID: 0010205614 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(96)03013-7 Document Type: Article

Times cited : (4)

References (10)

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