Interface reaction characterization and interfacial effects in multilayers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 204-213

  Barbee Jr , Troy W ^a   Wall, Mark ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Chemical reactions; Interfaces; Multilayers; Stability; Transmission electron microscopy; X ray optics

Indexed keywords

INTERFACES (MATERIALS); SURFACE CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; X RAY OPTICS;

INTERFACIAL STRUCTURES;

OPTICAL MULTILAYERS;

EID: 0031310442     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278849     Document Type: Conference Paper

References (12)

1. Multilayers for X-ray optics
2. Small angle interferences of X-rays reflected from periodic and near periodic multilayers
3. Evaporated multilayer dispersion elements for soft X-rays
4. Kinetic ellipsometry applied to soft X-ray multilayer growth
5. In situ ellipsometric study of the optical properties of ultra thin films
6. Characterization of multilayer coatings by X-ray reflection
7. Techniques for characterizing artificial layer structures using the Fresnel method
8. Measurement of roughness of W/Si multilayers by the Fresnel method
9. Characterization of Pd-B, Ag-B and Si-B interfaces
10. Evanescent and standing wave fluorescence from a multilayer structure