Exponential time response in analogue and geiger mode avalanche photodiodes

IEEE Transactions on Electron Devices

Volumn 52, Issue 7, 2005, Pages 1527-1534

  Groves, C ^a   Tan, C H ^a   David, J P R ^a   Rees, G J ^a   Hayat, M M ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b University of New Mexico   (United States)

Author keywords

Avalanche dioedes; Impact ionization; Timing jitter

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELDS; HETEROJUNCTIONS; IMPACT IONIZATION; PHOTODIODES; PROBABILITY DISTRIBUTIONS; TIMING JITTER;

AVALANCHE PHOTODIODES; MEAN CURRENT;

AVALANCHE DIODES;

EID: 23944485262     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.850943     Document Type: Article

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