Calculation of APD impulse response using a space- and time-dependent ionization probability distribution function

Journal of Lightwave Technology

Volumn 21, Issue 1, 2003, Pages 155-159

  Tan, C H ^a   Hambleton, P J ^a   David, J P R ^a   Tozer, R C ^a   Rees, G J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Avalanche photodiodes; Diffusion process; Impact ionization; Regenerative stochastic process; Transient response

Indexed keywords

AVALANCHE DIODES; CALCULATIONS; ELECTRON TRANSPORT PROPERTIES; IMPACT IONIZATION; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES;

AVALANCHE PHOTODIODES; CARRIER TRANSPORT; TRANSIENT RESPONSE;

PHOTODIODES;

EID: 0037261197     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2002.806332     Document Type: Article

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