New perspectives in gamma-ray imaging with CdZnTe/CdTe

IEEE Nuclear Science Symposium Conference Record

Volumn 4, Issue , 2004, Pages 2313-2319

  Verger, L ^a   Drezet, A ^a   Gros D'Aillon, E ^a   Mestais, C ^a   Monnet, O ^a   Montemont G ^a   Dierre, F ^a   Peyret, O ^a  

^a CEA LETI   (France)

Author keywords

PET; SPECT; ASIC; Bi Parametric correction; Crystal growth; CZT; Digital processing; Reliability

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CADMIUM COMPOUNDS; CRYSTAL GROWTH; DIGITAL SIGNAL PROCESSING; ELECTRODES; GAMMA RAYS; PHOTOMULTIPLIERS; POSITRON EMISSION TOMOGRAPHY; RADIATION DETECTORS; RELIABILITY;

ΜPET; ΜSPECT; BI-PARAMETRIC CORRECTION; CZT;

IMAGING TECHNIQUES;

EID: 23844539397     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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