Role of uniformity and geometry in IMARAD-type gamma-ray spectrometers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 16-26

  Schlesinger, T E ^a   Greaves, M ^a   Ross, S ^a   Brunett, B A ^a   Van Scyoc III, J M ^a   James, R B ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; RADIATION DETECTORS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR GROWTH;

BRIDGMAN METHOD; CADMIUM ZINC TELLURIDE; SEMICONDUCTOR DETECTORS;

GAMMA RAY SPECTROMETERS;

EID: 0033311169     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366571     Document Type: Conference Paper

References (13)