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Volumn 458, Issue 1-2, 2001, Pages 297-309

Characterization of CdTe and CdZnTe detectors for gamma-ray imaging applications

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; GAMMA RAYS; SEMICONDUCTING CADMIUM TELLURIDE; SOLID STATE DEVICES;

EID: 0035250949     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00874-3     Document Type: Article
Times cited : (75)

References (21)
  • 9
    • 0033308764 scopus 로고    scopus 로고
    • C. Szeles, E.E. Eissler, D.J. Reese, S.E. Cameron, SPIE 3768 (1999), p. 98
    • C. Szeles, E.E. Eissler, D.J. Reese, S.E. Cameron, SPIE 3768 (1999), p. 98.
  • 12
    • 0033308762 scopus 로고    scopus 로고
    • T. Narita, P.F. Bloser, J.E. Grindlay, J.A. Jenkis, H.W. Yao, SPIE 3768 (1999), p. 55.
    • T. Narita, P.F. Bloser, J.E. Grindlay, J.A. Jenkis, H.W. Yao, SPIE 3768 (1999), p. 55.
  • 16
    • 0033338989 scopus 로고    scopus 로고
    • O. Tousignant, L.A. Hamel, P. Dufour, F. Joly, J.R. Macri, M.L. McConnell, J.M. Ryan, V.T. Jordanov, SPIE 3768 (1999), p. 38.
    • O. Tousignant, L.A. Hamel, P. Dufour, F. Joly, J.R. Macri, M.L. McConnell, J.M. Ryan, V.T. Jordanov, SPIE 3768 (1999), p. 38.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.