메뉴 건너뛰기




Volumn 41, Issue 8, 2005, Pages 1092-1096

Effect of impact ionization in the InGaAs absorber on excess noise of avalanche photodiodes

Author keywords

Avalanche photodiodes; Impact ionization; Noise

Indexed keywords

AVALANCHE DIODES; ELECTRIC BREAKDOWN; IMPACT IONIZATION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SPURIOUS SIGNAL NOISE;

EID: 23844534746     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2005.850700     Document Type: Article
Times cited : (23)

References (15)
  • 1
    • 7544227495 scopus 로고    scopus 로고
    • "Recent advances in avalanche photodiodes"
    • Jul./Aug.
    • J. C. Campbell et al., "Recent advances in avalanche photodiodes," IEEE J. Sel. Topics Quantum Electron., vol. 10, no. 4, pp. 777-787, Jul./Aug. 2004.
    • (2004) IEEE J. Sel. Topics Quantum Electron. , vol.10 , Issue.4 , pp. 777-787
    • Campbell, J.C.1
  • 2
    • 36749115816 scopus 로고
    • 0.47 As photodiodes with dark current limited by generation-recombination and tunneling"
    • Aug.
    • 0.47 As photodiodes with dark current limited by generation-recombination and tunneling," Appl. Phys. Lett., vol. 37, no. 3, pp. 322-325, Aug. 1980.
    • (1980) Appl. Phys. Lett. , vol.37 , Issue.3 , pp. 322-325
    • Forrest, S.R.1    Leheny, R.F.2    Nahory, R.E.3    Pollack, M.A.4
  • 6
    • 0036851357 scopus 로고    scopus 로고
    • 0.48 As avalanche photodiode array"
    • Nov.
    • 0.48 As avalanche photodiode array," IEEE J. Quantum Electron., vol. 38, no. 11, pp. 1536-1540, Nov. 2002.
    • (2002) IEEE J. Quantum Electron. , vol.38 , Issue.11 , pp. 1536-1540
    • Zheng, X.G.1
  • 7
    • 33645352352 scopus 로고    scopus 로고
    • 0.48 As avalanche photodiodes and arrays"
    • Aug.
    • 0.48 As avalanche photodiodes and arrays," IEEE J. Quantum Electron., vol. 40, no. 8, pp. 1536-1540, Aug. 2004.
    • (2004) IEEE J. Quantum Electron. , vol.40 , Issue.8 , pp. 1536-1540
    • Zheng, X.G.1
  • 8
    • 0025404525 scopus 로고
    • "A theory of multiplication noise"
    • Mar.
    • J. N. Hollenhorst, "A theory of multiplication noise," IEEE Trans. Electron Devices, vol. 37, no. 3, pp. 781-788, Mar. 1990.
    • (1990) IEEE Trans. Electron Devices. , vol.37 , Issue.3 , pp. 781-788
    • Hollenhorst, J.N.1
  • 9
    • 0035367078 scopus 로고    scopus 로고
    • "Excess noise analysis of separate absorption multiplication region superlattice avalanche photodiode"
    • Jun.
    • N. F. Shih, "Excess noise analysis of separate absorption multiplication region superlattice avalanche photodiode," IEEE Trans. Electron Devices, vol. 48, no. 6, pp. 1075-1081, Jun. 2001.
    • (2001) IEEE Trans. Electron Devices. , vol.48 , Issue.6 , pp. 1075-1081
    • Shih, N.F.1
  • 10
    • 0026868198 scopus 로고
    • "Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes"
    • May
    • M. M. Hayat, W. L. Sargeant, and B. E. A. Saleh, "Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes," IEEE J. Quantum Electron., vol. 28, no. 5, pp. 1360-1365, May 1992.
    • (1992) IEEE J. Quantum Electron. , vol.28 , Issue.5 , pp. 1360-1365
    • Hayat, M.M.1    Sargeant, W.L.2    Saleh, B.E.A.3
  • 11
    • 0029754695 scopus 로고    scopus 로고
    • "Mean gain of avalanche photodiodes in a dead space model"
    • Jan.
    • A. Spinelli and A. L. Lacaita, "Mean gain of avalanche photodiodes in a dead space model," IEEE Trans. Electron Devices, vol. 43, no. 1, pp. 23-30, Jan. 1996.
    • (1996) IEEE Trans. Electron Devices. , vol.43 , Issue.1 , pp. 23-30
    • Spinelli, A.1    Lacaita, A.L.2
  • 12
    • 0022419601 scopus 로고
    • 0.53 As over the wavelength range 1.0-1.7 μm"
    • 0.53 As over the wavelength range 1.0-1.7 μm," Electron. Lett., vol. 21, no. 25/26, pp. 1187-1189, 1985.
    • (1985) Electron. Lett. , vol.21 , Issue.25-26 , pp. 1187-1189
    • Humphreys, D.A.1
  • 13
    • 0001361517 scopus 로고
    • "Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements"
    • L. W. Cook, G. E. Bulman, and G. E. Stillman, "Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements," Appl. Phys. Lett., vol. 40, no. 7, pp. 589-591, 1982.
    • (1982) Appl. Phys. Lett. , vol.40 , Issue.7 , pp. 589-591
    • Cook, L.W.1    Bulman, G.E.2    Stillman, G.E.3
  • 14
    • 33645352092 scopus 로고    scopus 로고
    • "Impact ionization measurement and modeling of long wavelength avalanche photodiodes"
    • Ph.D. dissertation, Univ. Sheffield, Sheffield, U.K., Feb.
    • J. S. Ng, "Impact ionization measurement and modeling of long wavelength avalanche photodiodes," Ph.D. dissertation, Univ. Sheffield, Sheffield, U.K., Feb. 2003.
    • (2003)
    • Ng, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.