-
1
-
-
0005908470
-
Radiation sensors
-
S. M. Sze, Ed. New York: Wiley
-
S. Audet and J. Steigerwald, "Radiation Sensors," in Semiconductor Sensors, S. M. Sze, Ed. New York: Wiley, 1994, pp. 271-329.
-
(1994)
Semiconductor Sensors
, pp. 271-329
-
-
Audet, S.1
Steigerwald, J.2
-
2
-
-
0031996560
-
Radiation effect on the ultrasonic attenuation and internal friction of tellurite glasses
-
Feb.
-
R. El Mallawany, A. A. El Rahamani, A. Abousehly, and E. Yousef, "Radiation effect on the ultrasonic attenuation and internal friction of tellurite glasses," Mater. Chem. Phys., vol. 52, pp. 161-165, Feb. 1998.
-
(1998)
Mater. Chem. Phys.
, vol.52
, pp. 161-165
-
-
El Mallawany, R.1
El Rahamani, A.A.2
Abousehly, A.3
Yousef, E.4
-
3
-
-
0032140479
-
Radiation damage in scintillating crystals
-
Aug.
-
R. Y. Zhu, "Radiation damage in scintillating crystals," Nucl. Instrum. Meth. A, vol. 413, pp. 297-311, Aug. 1998.
-
(1998)
Nucl. Instrum. Meth. A
, vol.413
, pp. 297-311
-
-
Zhu, R.Y.1
-
4
-
-
0030263906
-
7 thin films
-
Oct.
-
7 thin films," Phys. C, vol. 269, pp. 207-219, Oct. 1996.
-
(1996)
Phys. C
, vol.269
, pp. 207-219
-
-
Tolpygo, S.K.1
Lin, J.-Y.2
Gurvitch, M.3
Hou, S.Y.4
Phillips, J.M.5
-
6
-
-
0035400306
-
5-Si structures
-
Jul.
-
5-Si structures," Microelect. J., vol. 32, pp. 553-562, Jul. 2001.
-
(2001)
Microelect. J.
, vol.32
, pp. 553-562
-
-
Atanassova, E.1
Paskaleva, A.2
Konakova, R.3
Spassov, D.4
Mitin, V.F.5
-
7
-
-
84906702532
-
γ-radiation dosimetry using screen printed nickel oxide thick films
-
K. Arshak, O. Korostynska, and J. Harris, "γ-radiation dosimetry using screen printed nickel oxide thick films," in Proc. 23rd. Int. Conf. MIEL, vol. 1, 2002, pp. 357-360.
-
(2002)
Proc. 23rd. Int. Conf. MIEL
, vol.1
, pp. 357-360
-
-
Arshak, K.1
Korostynska, O.2
Harris, J.3
-
9
-
-
0033830248
-
Ab initio theory of point defects in oxide materials: Structure, properties, chemical reactivity
-
May
-
G. Pacchioni, "Ab initio theory of point defects in oxide materials: Structure, properties, chemical reactivity," Solid State Sci., vol. 2, pp. 161-179, May 2000.
-
(2000)
Solid State Sci.
, vol.2
, pp. 161-179
-
-
Pacchioni, G.1
-
12
-
-
1542269542
-
Various structures based on nickel oxide thick films as gamma radiation sensors
-
K. Arshak, O. Korostynska, and F. Fahim, "Various structures based on nickel oxide thick films as gamma radiation sensors," Sensors, vol. 3, pp. 176-186, 2003.
-
(2003)
Sensors
, vol.3
, pp. 176-186
-
-
Arshak, K.1
Korostynska, O.2
Fahim, F.3
-
13
-
-
0042219773
-
A new device using the tunneling process in narrow p-n junctions
-
Mar.
-
L. Esaki and Y. Miyahara, "A new device using the tunneling process in narrow p-n junctions," Solid State Electron., vol. 1, pp. 13-14, Mar. 1960.
-
(1960)
Solid State Electron.
, vol.1
, pp. 13-14
-
-
Esaki, L.1
Miyahara, Y.2
-
14
-
-
0142157238
-
Radiation-induced changes in thin film structures
-
Aug.
-
K. Arshak and O. Korostynska, "Radiation-induced changes in thin film structures," Proc. Inst. Elect. Eng., vol. 150, pp. 361-366, Aug. 2003.
-
(2003)
Proc. Inst. Elect. Eng.
, vol.150
, pp. 361-366
-
-
Arshak, K.1
Korostynska, O.2
-
15
-
-
4544249997
-
Gamma radiation sensing properties of cerium oxide based thick film structures
-
_, "Gamma radiation sensing properties of cerium oxide based thick film structures," Sens. Actuators A, vol. 115, pp. 196-201, 2004.
-
(2004)
Sens. Actuators A
, vol.115
, pp. 196-201
-
-
-
16
-
-
1542273637
-
Gamma raidation sensing properties of NiO thick film pn-junctions
-
Jan.
-
O. Korostynska, K. Arshak, and M. Mahon, "Gamma raidation sensing properties of NiO thick film pn-junctions," Proc. IEEE, vol. 91, no. 1, pp. 79-83, Jan. 2003.
-
(2003)
Proc. IEEE
, vol.91
, Issue.1
, pp. 79-83
-
-
Korostynska, O.1
Arshak, K.2
Mahon, M.3
-
17
-
-
1242315622
-
Thick film pn-junctions based on mixed oxides of indium and silicon as gamma radiation sensors
-
K. Arshak, O. Korostynska, and J. Henry, "Thick film pn-junctions based on mixed oxides of indium and silicon as gamma radiation sensors," Microelectron. Int., vol. 21, pp. 19-27, 2004.
-
(2004)
Microelectron. Int.
, vol.21
, pp. 19-27
-
-
Arshak, K.1
Korostynska, O.2
Henry, J.3
-
18
-
-
0035445887
-
Theory of thermoluminescence gamma dose response: The unified interaction model
-
Sep.
-
Y. S. Horowitz, "Theory of thermoluminescence gamma dose response: The unified interaction model," Nucl. Instrum. Meth. B, vol. 184, pp. 68-84, Sep. 2001.
-
(2001)
Nucl. Instrum. Meth. B
, vol.184
, pp. 68-84
-
-
Horowitz, Y.S.1
-
19
-
-
0033130736
-
Influence of damage caused by Krions and neutrons on electrical properties of silicon detectors
-
May
-
N. Croitoru, E. Gubbini, P. G. Rancoita, M. Rattaggi, and A. Seidman, "Influence of damage caused by Krions and neutrons on electrical properties of silicon detectors," Nucl. Instrum. Meth. A, vol. 426, pp. 477-485, May 1999.
-
(1999)
Nucl. Instrum. Meth. A
, vol.426
, pp. 477-485
-
-
Croitoru, N.1
Gubbini, E.2
Rancoita, P.G.3
Rattaggi, M.4
Seidman, A.5
|