Gamma Radiation Sensing Properties of NiO Thick Film pn-junctions

Proceedings of IEEE Sensors

Volumn 2, Issue 1, 2003, Pages 79-83

  Korostynska, Olga ^a   Arshak, Khalil ^a   Mahon, Michael ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

Gamma radiation; Nickel oxide; pn junction; Thick film

Indexed keywords

CARBON; COST EFFECTIVENESS; CURRENT VOLTAGE CHARACTERISTICS; DOPING (ADDITIVES); DOSIMETRY; ELECTRIC POTENTIAL; ELECTROCHROMIC DEVICES; GAMMA RAYS; IONIZATION; NICKEL COMPOUNDS; SCREEN PRINTING; THICK FILMS;

NICKEL OXIDE; PN-JUNCTIONS;

SEMICONDUCTOR JUNCTIONS;

EID: 1542273637     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

1. Ragan, D. D., Svedlindh, P., and Granqvist, C. G., "Electrochromic Ni oxide films studied by magnetic measurements", Solar Energy Materials and Solar Cells, vol. 54, pp. 247-254, 1998.
2. Neubecker, A., Pompl, T., Doll, T., Hansch, W., and Eisele, I., "Ozone-enhanced molecular beam deposition of nickel oxide for sensor applications", Thin Solid Films, vol. 310, pp. 19-23, 1997.
3. Audet, S. and Steigerwald, J., "Radiation Sensors" in Semiconductor Sensors, Sze, S. M. eds., John Wiley & Sons, Inc., pp. 271-329, 1994.
4. Arshak, K., Korostynska, O., and Harris, J., "γradiation dosimetry using screen printed nickel oxide thick films", Proc.23rd.Int.Conf.on Microel.(MIEL), vol. 1, pp. 357-360, 2002.
5. 2 mixed catalysts in hydrogen peroxide decomposition and influence of ionizing radiation", Radiation Physics and Chemistry, vol. 59, pp. 467-475, 2000.
6. Mucka, V. and Baburek, E., "Catalytic properties of nickel-yttrium mixed oxides and the influence of ionizing radiation", Radiation Physics and Chemistry, vol. 53, pp. 483-489, 1998.
7. Knoll, G. F., Radiation detection and measurement, John Wiley & Sons, 1979.
8. Zhu, R. Y., "Radiation damage in scintillating crystals", Nucl. Instrum. Meth. A:, vol. 413, pp. 297-311, 1998.
9. Kaczmarek, S. M., Jablonski, R., Moroz, Z., Pracka, I., and Lukasiewicz, T., "Radiation defects in oxide compounds", Cryst.Res.Technol., vol. 34, pp. 719-728, 1999.
10. Prudenziati, M., Handbook of sensors and actuators. Thick film sensors, Elsevier, 1994.
11. Powder Diffraction File, Joint Committee on Powder diffraction, International Center for Diffraction Data, Swarthmore, Card. 4-0835. 1987.
12. Holmes-Siedle, A. G. and Adams, L., Handbook of radiation effects, Oxford; New York: Oxford University Press, 1993.
13. Esaki, L. and Miyahara, Y., "A new device using the tunneling process in narrow p-n junctions", Solid-State Electronics, vol. 1, pp. 13-14, 1960.
14. 5-Si structures", Microelectronics J., vol. 32, pp. 553-562, 2001.
15. Horowitz, Y. S., "Theory of thermoluminescence gamma dose response: The unified interaction model", Nucl. Instrum. Meth. B:, vol. 184, pp. 68-84, 2001.