Radiation-induced changes in thin film structures

IEE Proceedings: Circuits, Devices and Systems

Volumn 150, Issue 4, 2003, Pages 361-366

  Arshak, K ^a   Korostynska, O ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DOSIMETRY; GAMMA RAYS; MIXTURES; SILICON COMPOUNDS; TELLURIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

RADIATION INDUCED DAMAGES;

THIN FILM TRANSISTORS;

EID: 0142157238     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20030664     Document Type: Conference Paper

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