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Volumn 426, Issue 2, 1999, Pages 477-485
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Influence of damage caused by Kr ions and neutrons on electrical properties of silicon detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY OF SOLIDS;
HALL EFFECT;
ION BOMBARDMENT;
KRYPTON;
NEUTRON IRRADIATION;
RADIATION DAMAGE;
SILICON SENSORS;
THERMAL EFFECTS;
HALL EFFECT COEFFICIENT;
SILICON DETECTORS;
PARTICLE DETECTORS;
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EID: 0033130736
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(98)01421-1 Document Type: Article |
Times cited : (14)
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References (27)
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