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Volumn 426, Issue 2, 1999, Pages 477-485

Influence of damage caused by Kr ions and neutrons on electrical properties of silicon detectors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; HALL EFFECT; ION BOMBARDMENT; KRYPTON; NEUTRON IRRADIATION; RADIATION DAMAGE; SILICON SENSORS; THERMAL EFFECTS;

EID: 0033130736     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01421-1     Document Type: Article
Times cited : (14)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.