Test point insertion algorithm for mixed-signal circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 319-324

  Zhang, Jinyan ^a   Huynh, Sam ^a   Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; DIGITAL DEVICES; FAILURE ANALYSIS; MATHEMATICAL MODELS; MIXER CIRCUITS; POWER SUPPLY CIRCUITS; TRANSFER FUNCTIONS;

ANALOG MODELS; MIXED SIGNAL CIRCUITS; TEST POINT INSERTION ALGORITHM;

INTEGRATED CIRCUIT TESTING;

EID: 0032684763     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)