Characterization of titanium chromium nitride nanocomposite protective coatings

Applied Surface Science

Volumn 229, Issue 1-4, 2004, Pages 387-394

  Aouadi, S M ^a   Wong, K C ^b   Mitchell, K A R ^b   Namavar, F ^c   Tobin, E ^c   Mihut, D M ^d   Rohde, S L ^d  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c SPIRE CORPORATION   (United States)

^d UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Ellipsometry; Nanostructures; Nitrides; Sputtering; X ray photoelectron spectroscopy

Indexed keywords

INDENTATION; ION BEAM ASSISTED DEPOSITION; MECHANICAL TESTING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NITRIDES; SPUTTERING; STAINLESS STEEL; TITANIUM COMPOUNDS; TRIBOLOGY; WEAR OF MATERIALS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

OPTICAL CONSTANTS; PHASE COMPOSITIONS; SPECTROSCOPIC ELLIPSOMETRY; TITANIUM CHROMIUM NITRIDE;

PROTECTIVE COATINGS;

EID: 2342619508     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.02.019     Document Type: Article

References (30)

1. Wiedemann R., Weihnacht V., Oettel H. Surf. Coat. Technol. 116-119:1999;302.
2. Mitterer C., Ubleis A., Ebner R. Mater. Sci. Eng. A. 140:1991;670.
3. Wiemer C., Lévy F., Bussy F. Surf. Coat. Technol. 68-69:1994;181.
4. Kim B.J., Lee S.H., Lee J.J. J. Mater. Sci. Lett. 16:1997;1597.
5. Musil J., Zeman P., Hruby H., Mayrhofer P.H. Surf. Coat. Technol. 120-121:1999;179.
6. Voevodin A.A., Capano M.A., Laube S.J.P., Donley M.S., Zabinski J.S. Thin Solid Films. 298:1997;107.
7. Knotek O., Loffler F., Kramer G. Surf. Coat. Technol. 59:1993;14.
8. Shtansky D.V., Kaneko K., Ikuhara Y., Levashov E.A. Surf. Coat. Technol. 148:2001;206.
9. Vepřek S. J. Vac. Sci. Technol. A17:1999;2401.
10. Hauert R., Patscheider J. Adv. Eng. Mater. 2:2000;247.
11. Musil J. Surf. Coat. Technol. 125:2000;322.
12. Voevodin A.A., Zabinski J.S. Thin Solid Films. 370:2000;223.
13. Voevodin A.A., Zabinski J.S. J. Mater. Sci. 33:1998;319.
14. Voevodin A.A., Hu J.J., Jones J.G., Fitz T.A., Zabinski J.S. Thin Solid Films. 401:2001;187.
15. S.M. Aouadi, E. Tobin, F. Namavar, T.Z. Gorishnyy, S.L. Rohde, in: Proceedings of the 44th Annual Technical Conference of the Society of Vacuum Coaters, Philadelphia, USA, 21-26 April 2001, p. 9.
16. T.Z. Gorishnyy, S.M. Aouadi, D.M. Mihut, S.L. Rohde, Thin Solid Films 445 (2003) 96.
17. Aouadi S.M., Gorishnyy T., Namavar F., Rohde S.L. Surf. Coat. Technol. 160:2002;145.
18. J.A. Woollam Co. Inc., Guide to Using WVASE32™, Lincoln, NE, 1997.
19. C.D. Wagner, Handbook of XPS, Physical Electronics Inc., Minnesota, 1995.
20. B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley, USA, 1978.
21. Bruggeman D.A.G. Ann. Phys. 24:1935;636.
22. E.D. Palik (Ed.), Handbook of Optical Constants II, Academic Press, New York, 1991.
23. E.D. Palik (Ed.), Handbook of Optical Constants III, Academic Press, New York, 1997.
24. D.M. Mihut, Ellipsometric and finite element modeling of chromium nitride thin films, M.Sc. Thesis, University of Nebraska, Lincoln, 1999.
25. Aouadi S.M., Mihut D.M., Kurrupu M.L., Kurkpatrick S.R., Rohde S.L. J. Vac. Sci. Technol. A. 19:2001;2800.
26. R.E. Hummel, P. Wißmann, Handbook of Optical Properties: Optics of Small Particles, Interfaces, and Surfaces, vol. II, CRC Press, New York, 1995.
27. Hones P., Sanjines R., Levy F. Thin Solid Films. 332:1998;240.
28. Lee K.H., Park C.H., Yoon Y.S., Lee J.J. Thin Solid Films. 385:2001;167.
29. Nainaparampil J.J., Zabinski J.S., Korneyi-Both A. Thin Solid Films. 33:1998;88.
30. Vetter J., Scholl H.J., Knotek O. Surf. Coat. Technol. 74-75:1995;286.