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Volumn 332, Issue 1-2, 1998, Pages 240-246

Sputter deposited chromium nitride based ternary compounds for hard coatings

Author keywords

CrN; Magnetron sputtering; Ternary compounds; Transition metal nitrides

Indexed keywords

BAND STRUCTURE; CHROMIUM ALLOYS; GRAIN SIZE AND SHAPE; HARDNESS; LATTICE CONSTANTS; MAGNETRON SPUTTERING; MORPHOLOGY; NITRIDES; SPUTTER DEPOSITION; TERNARY SYSTEMS; TEXTURES; THIN FILMS;

EID: 0032476281     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00992-4     Document Type: Article
Times cited : (158)

References (21)
  • 11
    • 0003459618 scopus 로고
    • W.H. Freeman, San Francisco, CA
    • A. Guinier, X-ray diffraction, W.H. Freeman, San Francisco, CA, 1963.
    • (1963) X-ray Diffraction
    • Guinier, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.