A built-in-self-test scheme for digital to analog converters

Proceedings of the IEEE International Conference on VLSI Design

Volumn 17, Issue , 2004, Pages 1027-1032

  Rafeeque, K P Sunil ^a   Vasudevan, Vinita ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN-SELF-TEST (BIST); CONTROL LOGIC; GAIN AMPLIFIERS; SYSTEM ON CHIP (SOC) DESIGN;

ANALOG COMPUTERS; APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC SWITCHES; ERROR ANALYSIS; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; VARIABLE FREQUENCY OSCILLATORS;

DIGITAL TO ANALOG CONVERSION;

EID: 2342612775     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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4. I.H.S.Hassan, K. Arabi, B. Kaminska, Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation International Conference on Computer Design ICCD'98, 1998 pp 40-46.
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