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Volumn 17, Issue , 2004, Pages 662-665

Exploring the novel characteristics of fully depleted dual-material gate (DMG) SOI MOSFET using two-dimensional numerical simulation studies

Author keywords

[No Author keywords available]

Indexed keywords

DUAL MATERIAL GATE (DMG); SHORT-CHANNEL EFFECTS (SCE); SINGLE MATERIAL GATE (SMG); WORKFUNCTIONS;

EID: 2342588638     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (11)
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  • 2
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  • 3
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    • Reliable Tantalum-Gate fully depleted SOI MOSFET technology featuring low-temperature processing
    • T. Ushiki, et al., "Reliable Tantalum-Gate fully depleted SOI MOSFET technology featuring low-temperature processing," IEEE Trans. Electron Devices, vol. 44, pp 1467-1472, 1997.
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    • Ushiki, T.1
  • 4
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    • Calculated threshold voltage characteristics of an XMOS transistor having an additional bottom gate
    • I. Sekigawa and Y. Hayashi, "Calculated threshold voltage characteristics of an XMOS transistor having an additional bottom gate," Solid-State Electronics, Vol. 27, No. 8-9, pp. 827-828, 1984.
    • (1984) Solid-state Electronics , vol.27 , Issue.8-9 , pp. 827-828
    • Sekigawa, I.1    Hayashi, Y.2
  • 5
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    • Sub-60-nm quasiplanar FinFET's fabricated using a simplified process
    • N. Lindert, et al., "Sub-60-nm quasiplanar FinFET's fabricated using a simplified process," IEEE Electron Device Lett., vol. 22, pp. 487-489, 2001.
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    • Lindert, N.1
  • 6
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    • Dual material gate (DMG) field effect transistor
    • W. Long, et al., "Dual material gate (DMG) field effect transistor," IEEE Trans. Electron Devices, vol. 46, pp.865-870, 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 865-870
    • Long, W.1
  • 7
    • 1942485694 scopus 로고    scopus 로고
    • Technology Modeling Associates, Inc., Palo Alto, CA
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    • (1997) MEDICI 4.0
  • 8
    • 0032651256 scopus 로고    scopus 로고
    • A simple and unambiguous definition of threshold voltage and its implications in deep-submicron MOS device modeling
    • X. Zhou, et al., "A simple and unambiguous definition of threshold voltage and its implications in deep-submicron MOS device modeling," IEEE Trans. Electron Devices, vol. 46, pp. 807-809, 1999.
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  • 9
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  • 10
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    • X. Zhou, "Exploring the novel characteristics of Hetero-Material Gate Field-Effect transistors (HMGFET's) with gate-material engineering," IEEE Trans. Electron Devices, vol. 47, pp.113-120, 2000.
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  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.